PoužitíSurface measuring device with free scanning and automatic zero positioning for precise and standardised roughness and waviness measurements.
Provedení- All R-, P and W-profiles can be measured precisely
- Manual feed with integrated start button for one-handed operation
- Motorised probe lowering for automatic positioning and raising after measurement
- Measure in any position and at any angle, including overhead
- Flexible programme design and logging
- Export characteristic values and profiles, optional statistic interfaces
- Includes measurement and evaluation software Evovis Mobile Standard
- Probe connection: TK probe (6-pin), measuring range +/-300 µm, resolution 1 nm, probe lowering 4 mm
- Guide precision 0.2 µm/20 mm, measuring speed 0.2-2 mm/s, positioning accuracy 0.2-3 mm/s
Výhoda- With Evovis mobile software, supports the 'latest' roughness standard ISO 21920 (in scope of delivery)
- Supports reference surface probes and skidded tracers
- Wide range of probes
Dodávka1x Waveline Xmove20 feed unit
1x Waveline Evovis Mobile Standard software
1x TKU 300/600 probe
1x TS1 KE2/90 T1.9D D4/30 probe
Power adapter, cable
Tool set
Storage case