Rauheitsmessgerät W40 mit 2µm Taster und Software

Provedení

Katalogové č.: 1033927 101

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Popis

Použití
Surface measuring device with free scanning and automatic zero positioning for precise and standardised roughness and waviness measurements.

Provedení

All R-, P and W-profiles can be measured precisely
Manual feed with integrated start button for one-handed operation
Motorised probe lowering for automatic positioning and raising after measurement
Measure in any position and at any angle, including overhead
Flexible programme design and logging
Export characteristic values and profiles, optional statistic interfaces
Includes measurement and evaluation software Evovis Mobile Standard
Probe connection: TK probe (6-pin), measuring range +/-300 µm, resolution 1 nm, probe lowering 4 mm
Guide precision 0.2 µm/20 mm, measuring speed 0.2-2 mm/s, positioning accuracy 0.2-3 mm/s

Výhoda

With Evovis mobile software, supports the 'latest' roughness standard ISO 21920 (in scope of delivery)
Supports reference surface probes and skidded tracers
Wide range of probes

Dodávka
1x Waveline Xmove20 feed unit
1x Waveline Evovis Mobile Standard software
1x TKU 300/600 probe
1x TS1 KE2/90 T1.9D D4/30 probe
Power adapter, cable
Tool set
Storage case

Technická data

Značka: HOMMEL ETAMIC
Typ: Waveline W40 mit 2µm Tastspitze
Systém sondy: Systém volné sondy
Hrot sondy: 2 µm
Parametry: A1 | A2 | AR | AW MOTIF) | MR1 | MR2 | NR (MOTIF) | NW (MOTIF) | Pa | Pdc | Pmr | Ppc | Pq | Pt | Pz | R | Ra | Rc | Rdc | Rdg | RdL | Rdq | Rk | Rmax | Rmr | Rp | Rp (ASME) | Rpc | Rpk | Rq | Rsk | Rsm | Rt | Rv | Rvk | Rx | Rz | Rz (JIS) | W | Wa | Wq | WSk | WSm | Wt | Wte (MOTIF) | Wx (MOTIF)
Úhel hrotu sondy: 90 Stupňů
Typ přenosu dat: Kabel